The VTE-3100E is the #1 choice world-wide for official compliance and engineering test solutions for Flash memory cards. The system also supports all common NAND devices on the market. 
The VTE-3100E offers more flexibility than any other tester on the market, supporting the current Flash cards on the market. 
The VTE-3100E can be configured internally under software control with customized test processors, supporting any type of Flash memory storage device, and offering true real-time test capabilities. 
A Protocol Analyzer configuration of the VTE-3100Eis also offered, supporting current flash memory storage and host devices.

Features:

? Adapters available for: UHS-I SD, eMMC, eMCP or NAND Flash memory storage devices 

? The compact size and USB interface make the VTE-3100 a portable, easy-to-install engineering tool 
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? Clock Speeds up to 208Mhz+ 

? Supports Vdd voltages from 0.8 to 5V 

? Supports 1/4/8/16 bit data bus 

? True RMS Idd Current Measurement 

? Clock shift capability versus data/control signals with 50pS resolution 

? Windows Vista, Windows 7 or Windows 8 operating systems supported 

? Scripts 100% compatible with production testers

Above: VTE-3100E with VTE Protocol Analyzer Pass-Through Cable Inserted into Host Device

Above: VTE-3100E test adapter supporting UHS-1 SD cards, HS-MMC cards and a multi-socket uBGA adapter supporting all eMMC BGA package types

Above: Actual VTE-3100E Test SW Library Screen Capture with optional embedd Protocol Analyzer

Above: Actual VTE-3100E with dual socket adapte

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