新闻  |   论坛  |   博客  |   在线研讨会
TestMetrix-深圳市锐测电子科技有限公司
zhulin132 | 2015-03-12 09:34:50    阅读:1310   发布文章

The VTE-3100E is the #1 choice world-wide for official compliance and engineering test solutions for Flash memory cards. The system also supports all common NAND devices on the market. 
The VTE-3100E offers more flexibility than any other tester on the market, supporting the current Flash cards on the market. 
The VTE-3100E can be configured internally under software control with customized test processors, supporting any type of Flash memory storage device, and offering true real-time test capabilities. 
A Protocol Analyzer configuration of the VTE-3100Eis also offered, supporting current flash memory storage and host devices.

Features:

? Adapters available for: UHS-I SD, eMMC, eMCP or NAND Flash memory storage devices 

?
 The compact size and USB interface make the VTE-3100 a portable, easy-to-install engineering tool 
深圳市锐测电子科技有限公司    联系人: 朱琳     Tel:18603045783

? Clock Speeds up to 208Mhz+ 

?
 Supports Vdd voltages from 0.8 to 5V 

?
 Supports 1/4/8/16 bit data bus 

?
 True RMS Idd Current Measurement 

?
 Clock shift capability versus data/control signals with 50pS resolution 

?
 Windows Vista, Windows 7 or Windows 8 operating systems supported 

? Scripts 100% compatible with production testers


Above: VTE-3100E with VTE Protocol Analyzer Pass-Through Cable Inserted into Host Device


Above: VTE-3100E test adapter supporting UHS-1 SD cards, HS-MMC cards and a multi-socket uBGA adapter supporting all eMMC BGA package types


Above: Actual VTE-3100E Test SW Library Screen Capture with optional embedd Protocol Analyzer


Above: Actual VTE-3100E with dual socket adapte

 

*博客内容为网友个人发布,仅代表博主个人观点,如有侵权请联系工作人员删除。

参与讨论
登录后参与讨论
推荐文章
最近访客